Loading a Probe on the Dimension Scanner
To load and unload a probe from the Dimension Icon you will need to use the probe holder stand. The probe holder stand is a 2.5-inch diameter black anodized aluminum cylinder that ships with the Dimension Icon SPM to facilitate installation of the probe substrate onto the Dimension Scanner Probe Holders. The probe holder stand has three stations for different probe holders:
- Standard AFM
- Fluid imaging AFM
- STM
A small, raised block in the center of the gold connector identifies the standard AFM load station. All load stations have asymmetric pin orientation, ensuring that the probe holders can only be installed in the correct direction:
The following procedure steps through the process of removing the currently installed probe holder, exchanging the probe, and reinstalling the probe holder with a new probe in place.
- Remove the probe holder from the Dimension SPM Scanner.
- Loosen the screw located on the right side of the Dimension Icon scanner dovetail to release the scanner.
- Carefully lift the scanner out of the dovetail mount with one hand and carefully remove the probe holder with the other hand.
- Replace the scanner in the dovetail mount.
CAUTION: Never place the scanner anywhere other than its home location in the dovetail mount. If the scanner needs to be removed from the system, place the scanner directly in its secure carrying case. Never place the scanner on a table or on the XY stage.
- With the probe holder's large spring clip face up, mate the probe holder sockets to the pins of the appropriate station of the probe holder stand (the standard probe holder is shown below):
- Retract the spring loaded probe clip by pressing down and pulling gently backwards.
- Remove the current probe with tweezers. Place the current probe in a safe location or dispose of it.
- Using sharp tweezers, grasp the new probe substrate firmly on the sides and lift to free the substrate from the gel-pack. In the gel-pack boxes the tip ends are pointing upward and do not need to be turned over before being placed in the probe holder.
NOTE: Refer to
Probe Handling for detailed information on how to break out each substrate from the wafer.
- Many silicon nitride substrates have cantilevers on both ends of the substrate. If this is the case, place the substrate under an optical microscope or magnifier and locate the tip you want to use.
- Press down and slide back the spring-loaded clip of the standard AFM probe holder (figure 1, below).
Figure 1: Standard AFM probe holder
NOTE: Install substrates face-up so the tip points away from the AFM probe holder. This ensures that the cantilever and tip face toward the sample once the probe holder is mounted on the scanner.
- Grip the new probe with tweezers firmly and carefully place the probe in the substrate mounting groove with the cantilever intended for imaging oriented away from the probe holder.
- Carefully maneuver the substrate until the substrate is flush against the back edge and laying flat in the groove.
- Press the spring-loaded probe clip down, gently push forward over the substrate, and release the spring clip to hold the substrate in place.
HINT: Always orienting the substrate to one side and the back of the probe holder groove will improve repeatability of tip location between runs. This will also make aligning the laser onto the cantilever quicker and easier when installing new cantilevers.
- Install the probe holder back onto the scanner.
- Hold the scanner securely with the right hand and gently slide the scanner up and away from the stage.
- Install the probe holder onto the bottom of the scanner.
- Engage the dovetail by tightening the scanner fastening screw.
NOTE: Just as with the probe holder, the orientation of the pins on the bottom of the Dimension Icon scanner are asymmetrical.
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112 Robin Hill Rd. |
nanoscaleworld.bruker-axs.com/nanoscaleworld/
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